AS1123
Datasheet - D e t a i l e d D e s c r i p t i o n
Figure 13. Switching Global Error Mode Timing Diagram
OEN
t TESTING
t GSW(ERROR)
LD
t SU(ERROR)
t GSW(ERROR)
CLK
t P(I/O)
t GSW(ERROR)
t P(I/O)
t P(I/O)
SDI
T FLAG(IN)
O FLAG(IN)
S FLAG(IN)
SDO
Don’t
Care
T FLAG
Don’t
Care
O FLAG
Don’t
Care
S FLAG
Acquisition of
t P4
t SW(ERROR)
t SW(ERROR)
Error Status
Error-Detection Mode
Acquisition of the error status occurs at the rising edge of OEN. Error-detection mode is started on the rising edge of LD when OEN is high. The
CLK signal must be low when entering error detection mode. Error detection for open- and shorted-LEDs can only be performed for LEDs that
are switched on during test time. To switch between error-detection modes clock pulses are needed (see Table 5) .
Note: To test all LEDs, a test pattern that turns on all LEDs must be input to the AS1123.
Global Error Mode
Global error mode is entered when error-detection mode is started. Clock pulses during this period are used to select between temperature,
open-LED, and shorted-LED tests, as well as low-current diagnostic mode and shutdown mode (see Table 5) . In global error mode, an error flag
(T FLAG, O FLAG, S FLAG ) is delivered to pin SDO if any errors are encountered.
Table 5. Global Error Mode Selections
Clock
Pulses
0
1
2
3
4
Output Port
Don't Care
Enabled
Enabled
Don't Care
Don't Care
Error-Detection Mode
Over-Temperature Detection
Open-LED Detection
Shorted-LED Detection
Low-Current Diagnostic Mode
V THH Level
Global Error Flag/Shutdown Condition
T FLAG = SDO = 1: No over-temperature warning.
T FLAG = SDO = 0: Over-temperature warning.
O FLAG = SDO = 1: No open-LED error.
O FLAG = SDO = 0: Open-LED error.
S FLAG = SDO = 1: No shorted-LED error.
S FLAG = SDO = 0: Shorted-LED error.
SDI = 1: Level1, V THH set to 54% V DD (default)
SDI = 0: Level2, V THH set to 80% V DD
Note: For a valid result SDI must be 1 for the first device.
If there are multiple AS1123s in a chain, the error flag will be gated through all devices. To get a valid result at the end of the chain, a logic 1 must
be applied to the SDI input of the first device of the chain. If one device produces an error this error will show up after n *t P(I/O) + t SW(ERROR) at
pin SDO of the last device in the chain. This means it is not possible to identify which device in the chain produced the error. Therefore, if a global
error occurs, the detailed error report can be run to identify which AS1123, or LED produced the error.
Note: When no error has occurred, the detailed error report can be skipped, setting LD and subsequently OEN low.
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